TPC2190/TPC2192/TPC2190M(3PEAK思瑞浦)
- The TPC219 is faimily of high accuracy DACs with 16 14and 12bit resolution which are all pin-compatible.The device includes a 2.5V internal reference which canbe used to reduce system complexitySeveral gain options could be selected to pr
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The TPC219 is faimily of high accuracy DACs with 16, 14and 12bit resolution which are all pin-compatible.The device includes a 2.5V internal reference, which canbe used to reduce system complexitySeveral gain options could be selected to provide differentfull scale output voltages, 1.25V, 2.5V and 5V.The device operates under a single analog supply, andhas seperate VIO supply for digital communication. Thecommunication is performed through a serial interface, andcan operate under wide range VIO supply voltage.A power on reset circuit is intergraged to maintain the DACoutput at zero scale or midscale.The device is characterized for temeprature range of -40℃to 125 ℃. And is available in small package of QFN andWLCSP.
Features
• High accuraccy
– INL: typical ±1LSB at 16-bit Resolution
• Integrated 2.5V Internal Reference
– Low Drift: 5ppm/℃
• Flexible output configuration
– User selectable Gain: 1/2, 1, 2
– Reset to Zero Scale or Midscale
• High output current capability: 20mA
• Serial Interfaces
– 4 Wire SPI Compatible Serial Interface
– Daisy Chain Operation
– CRC Error Check
• Temperature Range: −40°C to +125°C
• Package: QFN 3X3-16, WLCSP 2.4X2.4-16
Applications
• Industrial automation
• Optical networking
• Data Acquisition Systems
Features
• High accuraccy
– INL: typical ±1LSB at 16-bit Resolution
• Integrated 2.5V Internal Reference
– Low Drift: 5ppm/℃
• Flexible output configuration
– User selectable Gain: 1/2, 1, 2
– Reset to Zero Scale or Midscale
• High output current capability: 20mA
• Serial Interfaces
– 4 Wire SPI Compatible Serial Interface
– Daisy Chain Operation
– CRC Error Check
• Temperature Range: −40°C to +125°C
• Package: QFN 3X3-16, WLCSP 2.4X2.4-16
Applications
• Industrial automation
• Optical networking
• Data Acquisition Systems
